Forevision Analytical Lab
As the demand is growing in multifold for facilities to test the samples and to train the staff/students in various fields of Nanoscience & Nanotechnology applications, we have started FOREVISION ANALYTICAL LAB, which was inaugurated on September 1, 2008 with Hitachi SEM & Thermo EDS. Added Park Systems Research AFM by January 2010.
The objectives of this Laboratory are
 
To arrange the demonstration of SEM/EDS and AFM for prospective buyers.
 
To analyze various samples on request at a nominal cost.
 
To provide Teaching & Training to the staff/students/Researchers of Academic
    Institutes/Organizations, who are in the line of Nanoscience & Nanotechnology or interested in Electron Microscopy and AFM techniques on charge basis
     
Park Systems High Resolution AFM XE-100:

XE-100 Versatile Research-grade AFM with motorized optics
Overview
Supports all AFM / STM Modes Spectroscopy
Decoupled XY (50µm x 50µm) and Z scanners (12µm) – enables flat XY scan without bowing effect
True Non-Contact AFM minimizes Tip-Sample interaction, means prolonged usage of tips for more and more scans
Larger working range: 25mm x 25mm XY stage moment
Larger Z Scan range: 12um
Built-in on-axis CCD tip-sample Viewing system with 1um resolution
   
Modes Available:
Contact Mode
True Non Contact Mode
Lateral Force Microscopy
Phase Imaging
Force- Distance Spectroscopy/ F-d volume imaging
Advanced Modes Available ON PRIOR REQUEST
Magnetic Force Microscopy
Electrostatic Force Microscopy
Scanning Tunneling Microscopy
Liquid Imaging
Conductive – AFM
Nanomanipulation/Nanolithography