Featured Webinars will be Updated Soon....
1. Event: | Online Webinar on Bruker’s Exclusive PeakForce Tapping® for 10 Years and Counting |
Date and time: | 22 JULY 2021 |
This Webinar illustrates how PeakForce Tapping works and offers unprecedented high-resolution imaging that extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping. |
2. Event: | Online Webinar on Advances in 3D Optical Profilers - Gage-capable, small footprint system for high resolution 3D-mapping. |
Date and time: | 24 February 2021 11:30 AM – 12:30 PM (IST) |
This webinar illustrates how advanced optical profilers accurately assess complex surface texture through areal roughness parameters.We discuss how these same profilers can be used to optimize manufacturing processes and then control the quality of the finishing step.Practical industrial cases will be shown- from a standard mechanical part used in orthopedics to a polymer 3D printed surface made using additive manufacturing. |
3. Event: | NANORACER - A REVOLUTION IN HIGH SPEED AFM IMAGING |
Date and time: | 28 JANUARY 2021 |
Description: | This webinar gives an introduction about Bruker NanoRacer, the newly developed fastest commercial high speed Bio-AFM which reflects pioneering work of Bruker JPK Bio-AFM team by combining technological advances with proven stability, sensi-tivity and ease of use. This system will allow high speed imaging in real time visualization so that the dynamic process of the biological samples are observed with nano-meter resolution. The NanoRacer opens a world of new and exciting possibilities for Life Science applications enabling researchers to gain an in-depth understanding of complex biological systems and molec-ular mechanisms. A detailed technical feature discussion will be covered during the webinar. |
4. 22 OCT 2020 | Online Webinar on Nanoscale Infrared Spectroscopy – A new chemical dimension to Atomic Force Microscopy |
Infrared (IR) spectroscopy is one of the most recognized analytical measurement techniques in academic, government, and industrial R&D laboratories for the characterization of materials. The spatial resolution of conventional bulk IR spectroscopy is limited by Abbe diffraction laws to between 3–10 µm, depending on the method used. Atomic force microscopy (AFM) is a widely used nanoscale imaging technique that provides the user with a high spatial resolution topographic map of a sample surface along with mechanical and electrical data. Until now, the major drawback of AFM has been its inability to chemically characterize the material underneath the tip. When combined with an IR source, the resulting AFM-IR technique breaks the diffraction limit of conventional IR spectroscopy by orders of magnitude, while still providing the high-resolution imaging capabilities of AFM. In this webinar we discuss the use of AFM-IR to address nanoscale chemical characterization on a range of polymeric and thin film samples. |
5. Event: | Online Webinar & Tool Demonstration on Non-Contact Optical Profiler: Measuring Profile and Roughness with 3D White Light Interferometry Profilers |
Date and time: | 22 SEP 2020 |
Description: | The 2D stylus profiling techniques was developed in the 1930s. This technique has been refined and is widely used for surface texture characterization until today. However, stylus profiling method has a few limitations such as there is a possibility of damaging the sample and stylus profiling can act as a mechanical filter if wrong stylus is used for roughness measurement. In this Webinar, A non-contact areal profilers using White Light Interferometer to measure roughness in both R&D and production environment will be introduced. The speaker will make a comparison between 2D Stylus and 3D Non-Contact method, discuss key concept for roughness consideration such as form, waviness and roughness using automotive and precision machining parts and ISO Standard parameters as example. |
6. Event: | Application of BioAFM in Molecular and Cell Biology |
Date and time: | Thursday, August 27, 2020 11:00 am India Time (Mumbai, GMT+05:30) |
Thursday, August 27, 2020 1:30 pm Singapore Time (Singapore, GMT+08:00) | |
Duration: | 1 Hour |
Description: | How do receptors recognize and bind to ligands? What influence the protein complex stability? Why do environmental changes affect cell behaviors? These are common questions raised by biochemists,biophysicists,and cell biologists. Beyond being an imaging technique,the atomic force microscopy (AFM) has extended its use to help answer such questions in various biomedical applications.Thanks to the new developments in recent years,AFM provides a veteran platform to investigate topography together with chemical, electrical,and mechanical properties,which helps fill the gap between the functionality study and phenomenon observation.In this webinar, we will briefly demonstrate how you can also benefit from AFM in biomedical studies, specifically covering the examples of biomedical adhesions, molecular recognition, mechanical stability of biomolecules / complexes, and mechanotransduction responses of cells will be presented by Dr.Yun Chen, Application Scientist, Bruker Nano Surfaces Division, Singapore. |
7. Event: | Overview of Surface Roughness Measurements, Choice of Techniques and Analysis |
Date and time: | Friday, August 21, 2020 4:00 PM |
Description: | Surface texture plays a crucial role in performance and reliability of a wide range of products ranging from automobile components, consumer electronics, photovoltaics to space applications. Accurate characterization of surface texture provides control over the manufacturing process and understanding the mechanism of product failure. Roughness is the most commonly used parameter to characterize surface texture. Thus, understanding of surface roughness measurement and analysis will help to optimize the manufacturing process and improve product quality. |
8. Event: | Capabilities of Atomic Force Microscopy (AFM) in Nanomaterial Characterization |
Date and time: | Thursday, July 30, 2020 11:00 AM |